Datasheet

SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670C – AUGUST 1996 – REVISED MARCH 1998
27
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)
SN54LVTH18514 SN74LVTH18514
V
CC
= 3.3 V
± 0.3 V
V
CC
= 2.7 V
V
CC
= 3.3 V
± 0.3 V
V
CC
= 2.7 V
UNIT
MIN MAX MIN MAX MIN MAX MIN MAX
f
clock
Clock frequency CLKAB or CLKBA 0 100 0 80 0 100 0 80 MHz
t
Pulse duration
CLKAB or CLKBA high or low 4.4 5.6 4.4 5.6
ns
t
w
P
u
lse
d
u
ration
LEAB or LEBA high 3 3 3 3
ns
A before CLKAB↑ or
B before CLKBA↑
2.4 2.8 2.4 2.8
t
su
Setup time
A before LEAB↓ or
CLK high 1.5 0.7 1.5 0.7
ns
su
A
before
LEAB↓
or
B before LEBA↓
CLK low 1.6 1.6 1.6 1.6
CLKEN before CLK↑
2.8 3.4 2.8 3.4
A after CLKAB↑ 1 0.8 1 0.8
t
h
Hold time
B after CLKBA↑ 1.4 1.1 1.4 1.1
ns
t
h
Hold
time
A after LEAB↓ or B after LEBA↓ 3.1 3.5 3.1 3.5
ns
CLKEN after CLK↑
0.7 0.2 0.7 0.2
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
SN54LVTH18514 SN74LVTH18514
V
CC
= 3.3 V
± 0.3 V
V
CC
= 2.7 V
V
CC
= 3.3 V
± 0.3 V
V
CC
= 2.7 V
UNIT
MIN MAX MIN MAX MIN MAX MIN MAX
f
clock
Clock frequency TCK 0 50 0 40 0 50 0 40 MHz
t
w
Pulse duration TCK high or low 9.5 10.5 9.5 10.5 ns
t
St ti
A, B, CLK, CLKEN, LE, or OE
before TCK↑
6.5 7 6.5 7
t
su
Setup time
TDI before TCK↑
2.5 3.5 2.5 3.5
ns
TMS before TCK↑ 2.5 3.5 2.5 3.5
t
Hldti
A, B, CLK, CLKEN, LE, or OE
after TCK↑
1.7 1 1.7 1
t
h
Hold time
TDI after TCK↑
1.5 1 1.5 1
ns
TMS after TCK↑ 1.5 1 1.5 1
t
d
Delay time Power up to TCK↑ 50 50 50 50 ns
t
r
Rise time V
CC
power up 1 1 1 1 µs
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