Datasheet

SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
30
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182512 SN74LVTH182512
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP
†
MAX MIN TYP
†
MAX
UNIT
V
IK
V
CC
= 2.7 V, I
I
= –18 mA –1.2 –1.2 V
A, B, TDO V
CC
= 2.7 V to 3.6 V, I
OH
= –100 µA V
CC
–0.2 V
CC
–0.2
V
CC
= 2.7 V, I
OH
= –3 mA 2.4 2.4
V
OH
A port,
I
OH
= –8 mA 2.4 2.4
V
V
OH
,
TDO
V
CC
= 3 V
I
OH
= –24 mA 2
V
I
OH
= –32 mA 2
B port V
CC
= 3 V, I
OH
= –12 mA 2 2
A, B, TDO V
CC
= 2.7 V, I
OL
= 100 µA 0.2 0.2
V
CC
= 2.7 V, I
OL
= 24 mA 0.5 0.5
At
I
OL
= 16 mA 0.4 0.4
V
OL
A port,
TDO
V
CC
=3V
I
OL
= 32 mA 0.5 0.5
V
TDO
V
CC
=
3
V
I
OL
= 48 mA 0.55
I
OL
= 64 mA 0.55
B port V
CC
= 3 V, I
OL
= 12 mA 0.8 0.8
CLK
,
V
CC
= 3.6 V, V
I
= V
CC
or GND ±1 ±1
CLK,
LE, TCK
V
CC
= 0 or 3.6 V, V
I
= 5.5 V 10 10
OE
V
I
= 5.5 V 5 5
I
I
OE,
TDI TMS
V
CC
= 3.6 V
V
I
= V
CC
1 1
µA
I
I
TDI
,
TMS
V
I
= 0 –25 –100 –25 –100
µ
A
AB
V
I
= 5.5 V 20 20
A or B
p
orts
‡
V
CC
= 3.6 V
V
I
= V
CC
1 1
orts
‡
V
I
= 0 –5 –5
I
off
V
CC
= 0, V
I
or V
O
= 0 to 4.5 V ±100 µA
I
§
A or B
V
CC
=3V
V
I
= 0.8 V 75 500 75 150 500
µA
I
I(hold)
§
ports
V
CC
=
3
V
V
I
= 2 V –75 –500 –75 –150 –500
µ
A
I
OZH
TDO V
CC
= 3.6 V, V
O
= 3 V 1 1 µA
I
OZL
TDO V
CC
= 3.6 V, V
O
= 0.5 V –1 –1 µA
I
OZPU
TDO V
CC
= 0 to 1.5 V, V
O
= 0.5 V or 3 V ±50 ±50 µA
I
OZPD
TDO V
CC
= 1.5 V to 0, V
O
= 0.5 V or 3 V ±50 ±50 µA
V
CC
=
3.6 V,
Outputs high 0.6 2 0.6 2
I
CC
V
CC
=
3
.
6
V
,
I
O
= 0,
Outputs low 18 24 18 24
mA
V
I
= V
CC
or GND
Outputs disabled 0.6 2 0.6 2
∆I
CC
¶
V
CC
= 3 V to 3.6 V, One input at V
CC
– 0.6 V,
Other inputs at V
CC
or GND
0.5 0.5 mA
C
i
V
I
= 3 V or 0 4 4 pF
C
io
V
O
= 3 V or 0 10 10 pF
C
o
V
O
= 3 V or 0 8 8 pF
†
All typical values are at V
CC
= 3.3 V, T
A
= 25°C.
‡
Unused pins at V
CC
or GND
§
The parameter I
I(hold)
includes the off-state output leakage current.
¶
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.
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design phase of development. Characteristic data and other
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change or discontinue these products without notice.