Datasheet

SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS667B – JULY 1996 – REVISED JUNE 1997
27
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH18504A SN74LVTH18504A
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP
†
MAX MIN TYP
†
MAX
UNIT
V
IK
V
CC
= 2.7 V, I
I
= –18 mA –1.2 –1.2 V
V
CC
= MIN to MAX
‡
, I
OH
= –100 µA V
CC
–0.2 V
CC
–0.2
V
CC
= 2.7 V, I
OH
= –3 mA 2.4 2.4
V
OH
I
OH
= –8 mA 2.4 2.4
V
V
CC
= 3 V
I
OH
= –24 mA 2
I
OH
= –32 mA 2
V
CC
=27V
I
OL
= 100 µA 0.2 0.2
V
CC
=
2
.
7
V
I
OL
= 24 mA 0.5 0.5
V
OL
I
OL
= 16 mA 0.4 0.4
V
V
OL
V
CC
=3V
I
OL
= 32 mA 0.5 0.5
V
V
CC
=
3
V
I
OL
= 48 mA 0.55
I
OL
= 64 mA 0.55
CLK,
CLKEN
V
CC
= 3.6 V, V
I
= V
CC
or GND ±1 ±1
CLKEN
,
LE, TCK
V
CC
= 0 or MAX
‡
, V
I
= 5.5 V 10 10
OE TDI
V
I
= 5.5 V 5 5
I
I
OE, TDI,
TMS
V
CC
= 3.6 V
V
I
= V
CC
1 1
µA
I
TMS
V
I
= 0 –25 –100 –25 –100
µ
AB
V
I
= 5.5 V 20 20
A or B
p
orts
§
V
CC
= 3.6 V
V
I
= V
CC
1 1
orts
§
V
I
= 0 –5 –5
I
off
V
CC
= 0, V
I
or V
O
= 0 to 4.5 V ±100 µA
I
¶
A or B
V
CC
=3V
V
I
= 0.8 V 75 500 75 150 500
µA
I
I(hold)
¶
ports
V
CC
=
3
V
V
I
= 2 V –75 –500 –75 –150 –500
µ
A
I
OZH
TDO V
CC
= 3.6 V, V
O
= 3 V 1 1 µA
I
OZL
TDO V
CC
= 3.6 V, V
O
= 0.5 V –1 –1 µA
I
OZPU
TDO V
CC
= 0 to 1.5 V, V
O
= 0.5 V or 3 V ±50 ±50 µA
I
OZPD
TDO V
CC
= 1.5 V to 0, V
O
= 0.5 V or 3 V ±50 ±50 µA
V
CC
=
3.6 V,
Outputs high 0.6 2 0.6 2
I
CC
V
CC
=
3
.
6
V
,
I
O
= 0,
Outputs low 19.5 27 19.5 27
mA
V
I
= V
CC
or GND
Outputs disabled 0.6 2 0.6 2
∆I
CC
#
V
CC
= 3 V to 3.6 V, One input at V
CC
– 0.6 V,
Other inputs at V
CC
or GND
0.5 0.5 mA
C
i
V
I
= 3 V or 0 4 4 pF
C
io
V
O
= 3 V or 0 10 10 pF
C
o
V
O
= 3 V or 0 8 8 pF
†
All typical values are at V
CC
= 3.3 V, T
A
= 25°C.
‡
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§
Unused pins at V
CC
or GND
¶
The parameter I
I(hold)
includes the off-state output leakage current.
#
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.