Datasheet

SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS668C − JULY 1996 − REVISED JUNE 2004
30
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions (see Note 4)
SN54LVTH182502A SN74LVTH182502A
UNIT
MIN MAX MIN MAX
UNIT
V
CC
Supply voltage 2.7 3.6 2.7 3.6 V
V
IH
High-level input voltage 2 2 V
V
IL
Low-level input voltage 0.8 0.8 V
V
I
Input voltage 5.5 5.5 V
I
High level output current
A port, TDO −24 −32
mA
I
OH
High-level output current
B port
−12 −12
mA
I
Low level output current
A port, TDO 24 32
mA
I
OL
Low-level output current
B port
12 12
mA
I
OL
†
Low-level output current A port, TDO 48 64 mA
Δt/Δv Input transition rise or fall rate Outputs enabled 10 10 ns/V
T
A
Operating free-air temperature −55 125 −40 85 °C
†
Current duty cycle ≤ 50%, f ≥ 1 kHz
NOTE 1: All unused CLK, LE, or TCK inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI
application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
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