Datasheet
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Absolute Maximum Ratings
(1)
Recommended Operating Conditions
(1)
SN54LVTH16541 , , SN74LVTH16541
3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS691E – MAY 1997 – REVISED NOVEMBER 2006
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
V
CC
Supply voltage range –0.5 4.6 V
V
I
Input voltage range
(2)
–0.5 7 V
V
O
Voltage range applied to any output in the high-impedance or power-off state
(2)
–0.5 7 V
V
O
Voltage range applied to any output in the high state
(2)
–0.5 V
CC
+ 0.5 V
SN54LVTH16541 96
I
O
Current into any output in the low state mA
SN74LVTH16541 128
SN54LVTH16541 48
I
O
Current into any output in the high state
(3)
mA
SN74LVTH16541 64
I
IK
Input clamp current V
I
< 0 –50 mA
I
OK
Output clamp current V
O
< 0 –50 mA
DGG package 89
θ
JA
Package thermal impedance
(4)
° C/W
DL package 94
T
stg
Storage temperature range –65 150 ° C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(3) This current flows only when the output is in the high state and V
O
> V
CC
.
(4) The package thermal impedance is calculated in accordance with JESD 51.
SN54LVTH16541 SN74LVTH16541
UNIT
MIN MAX MIN MAX
V
CC
Supply voltage 2.7 3.6 2.7 3.6 V
V
IH
High-level input voltage 2 2 V
V
IL
Low-level input voltage 0.8 0.8 V
V
I
Input voltage 5.5 5.5 V
I
OH
High-level output current –24 –32 mA
I
OL
Low-level output current 48 64 mA
∆ t/ ∆ v Input transition rise or fall rate Outputs enabled 10 10 ns/V
∆ t/ ∆ V
CC
Power-up ramp rate 200 200 µ s/V
T
A
Operating free-air temperature –55 125 –40 85 ° C
(1) All unused control inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
4
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