Datasheet

TG
C
C
TG
C
C
TG
C
C
C
TG
C
C
PRE
CLK
D
CLR
Q
Q
C
7
2
6
5
3
1
SN74LVC2G74
SCES203N –APRIL 1999–REVISED JULY 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTION TABLE
INPUTS OUTPUTS
PRE CLR CLK D Q Q
L H X X H L
H L X X L H
L L X X H
(1)
H
(1)
H H ↑ H H L
H H ↑ L L H
H H L X Q
0
Q
0
(1) This configuration is nonstable; that is, it does not persist when PRE or CLR returns to its inactive
(high) level.
LOGIC DIAGRAM (POSITIVE LOGIC)
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