Datasheet

OE1
OE2
To Seven Other Channels
A1
Y1
1
19
2 18
SN74LV541AT
SCES573B –JUNE 2004–REVISED JULY 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTION TABLE
(EACH BUFFER/DRIVER)
INPUTS
OUTPUT
Y
OE1 OE2 A
L L L L
L L H H
H X X Z
X H X Z
LOGIC DIAGRAM (POSITIVE LOGIC)
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