Datasheet

From Output
Under Test
R
L
V
CC
S1
S2
LOAD CIRCUIT
PARAMETER C
L
t
PZH
t
pd
or t
t
t
dis
t
en
t
PZL
t
PHZ
t
PLZ
1 k
1 k
50 pF
or
150 pF
50 pF
Open Closed
R
L
S1
Closed Open
S2
Open Closed
Closed Open
50 pF
or
150 pF
Open Open––
C
L
(see Note A)
Test
Point
VOLTAGE WAVEFORM
INPUT RISE AND FALL TIMES
1.3 V1.3 V
0.3 V0.3 V
2.7 V 2.7 V
3 V
0 V
t
r
t
f
Input
VOLTAGE WAVEFORMS
PROPAGATION DELAY AND OUTPUT RISE AND FALL TIMES
1.3 V
1.3 V1.3 V
10%10%
90% 90%
3 V
V
OH
V
OL
0 V
t
r
t
f
Input
In-Phase
Output
1.3 V
t
PLH
t
PHL
1.3 V 1.3 V
10% 10%
90%90%
V
OH
V
OL
t
r
t
f
t
PHL
t
PLH
Out-of-
Phase
Output
1.3 V
10%
90%
3 V
V
CC
V
OL
0 V
Output
Control
(Low-Level
Enabling)
Output
Waveform 1
(See Note B)
1.3 V
t
PZL
t
PLZ
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES FOR 3-STATE OUTPUTS
V
OH
0 V
1.3 V
1.3 V
t
PZH
t
PHZ
Output
Waveform 2
(See Note B)
8
SN54HCT245
,
SN74HCT245
SCLS020F MARCH 1984REVISED AUGUST 2016
www.ti.com
Product Folder Links: SN54HCT245 SN74HCT245
Submit Documentation Feedback Copyright © 1984–2016, Texas Instruments Incorporated
7 Parameter Measurement Information
A. C
L
includes probe and test-fixture capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output
control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output
control.
C. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having
the following characteristics: PRR 1 MHz, Z
O
= 50 Ω, t
r
= 6 ns, t
f
= 6 ns.
D. The outputs are measured one at a time with one input transition per measurement.
E. t
PLZ
and t
PHZ
are the same as t
dis
.
F. t
PZL
and t
PZH
are the same as t
en
.
G. t
PLH
and t
PHL
are the same as t
pd
.
Figure 2. Load Circuit and Voltage Waveforms