Datasheet
SN54HC164
,
SN74HC164
SCLS115G –DECEMBER 1982 –REVISED SEPTEMBER 2015
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN MAX UNITS
V
CC
Supply voltage −0.5 7 V
I
IK
Input clamp current
(2)
V
I
< 0 or V
I
> V
CC
±20 mA
I
OK
Output clamp current
(2)
V
O
< 0 or V
O
> V
CC
±20 mA
I
O
Continuous output current V
O
= 0 to V
CC
±25 mA
Continuous current through V
CC
or GND ±50 mA
T
stg
Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
7.2 ESD Ratings
VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001
(1)
±2000
V
(ESD)
Electrostatic discharge V
Charged-device model (CDM), per JEDEC specification JESD22-C101
(2)
±1000
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
(1)
SN54HC164 SN74HC164
UNIT
MIN NOM MAX MIN NOM MAX
V
CC
Supply voltage 2 5 6 2 5 6 V
V
CC
= 2 V 1.5 1.5
V
IH
High-level input voltage V
CC
= 4.5 V 3.15 3.15 V
V
CC
= 6 V 4.2 4.2
V
CC
= 2 V 0.5 0.5
V
IL
Low-level input voltage V
CC
= 4.5 V 1.35 1.35 V
V
CC
= 6 V 1.8 1.8
V
I
Input voltage 0 V
CC
0 V
CC
V
V
O
Output voltage 0 V
CC
0 V
CC
V
V
CC
= 2 V 1000 1000
Input transition rise and fall
Δt/Δv
(2)
V
CC
= 4.5 V 500 500 ns
time
V
CC
= 6 V 400 400
T
A
Operating free-air temperature –55 125 –40 125 °C
(1) All unused inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, SCBA004.
(2) If this device is used in the threshold region (from V
IL
max = 0.5 V to V
IH
min = 1.5 V), there is a potential to go into the wrong state from
induced grounding, causing double clocking. Operating with the inputs at t
t
= 1000 ns and V
CC
= 2 V does not damage the device;
however, functionally, the CLK inputs are not ensured while in the shift, count, or toggle operating modes.
6 Submit Documentation Feedback Copyright © 1982–2015, Texas Instruments Incorporated
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