Datasheet
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E − JUNE 1990 − REVISED JULY 1996
18
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251−1443
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 9)
V
CC
= 5 V,
T
A
= 25°C
SN54BCT8374A SN74BCT8374A
UNIT
MIN MAX MIN MAX MIN MAX
UNIT
f
clock
Clock frequency CLK 0 70 0 70 0 70 MHz
t
w
Pulse duration CLK high or low 5 5 5 ns
t
su
Setup time Data before CLK↑ 3 3 3 ns
t
h
Hold time Data after CLK↑ 2 2 2 ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 9)
V
CC
= 5 V,
T
A
= 25°C
SN54BCT8374A SN74BCT8374A
UNIT
MIN MAX MIN MAX MIN MAX
UNIT
f
clock
Clock frequency TCK 0 20 0 20 0 20 MHz
t
Pulse duration
TCK high or low 25 25 25
ns
t
w
Pulse duration
TMS double high
50* 50* 50
ns
Any D before TCK↑ 6 6 6
t
Setup time
CLK or OE before TCK↑ 6 6 6
ns
t
su
Setup time
TDI before TCK↑
6 6 6
ns
TMS before TCK↑ 12 12 12
Any D after TCK↑ 4.5 4.5 4.5
t
Hold time
CLK or OE after TCK↑ 4.5 4.5 4.5
ns
t
h
Hold time
TDI after TCK↑
4.5 4.5 4.5
ns
TMS after TCK↑ 0 0 0
t
d
Delay time Power up to TCK↑ 100* 100* 100 ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.