Datasheet

SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
18
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 9)
V
CC
= 5 V,
T
A
= 25°C
SN54BCT8240A SN74BCT8240A
UNIT
MIN MAX MIN MAX MIN MAX
f
clock
Clock frequency TCK 0 20 0 20 0 20 MHz
t
Pulse duration
TCK high or low 25 25 25
ns
t
w
P
u
lse
d
u
ration
TMS double high 50* 50* 50
ns
Any A before TCK↑ 6 6 6
t
Setu
p
time
Any OE before TCK↑ 6 6 6
ns
t
su
Set
u
p
time
TDI before TCK↑ 6 6 6
ns
TMS before TCK↑ 12 12 12
Any A after TCK↑ 4.5 4.5 4.5
t
h
Hold time
Any OE after TCK↑ 4.5 4.5 4.5
ns
t
h
Hold
time
TDI after TCK↑ 4.5 4.5 4.5
ns
TMS after TCK↑ 0 0 0
t
d
Delay time Power up to TCK↑ 100* 100* 100 ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.