Datasheet
SN54ABTR2245, SN74ABTR2245
OCTAL TRANSCEIVERS AND LINE/MEMORY DRIVERS
WITH 3-STATE OUTPUTS
SCBS680A – MARCH 1997 – REVISED MAY 1997
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
T
A
= 25°C SN54ABTR2245 SN74ABTR2245
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP
†
MAX MIN MAX MIN MAX
UNIT
V
IK
V
CC
= 4.5 V, I
I
= –18 mA –1.2 –1.2 –1.2 V
V
CC
= 4.5 V, I
OH
= –1 mA 3.35 3.3 3.35
V
OH
V
CC
= 5 V, I
OH
= –1 mA 3.85 3.8 3.85
V
V
OH
V
CC
=45V
I
OH
= –3 mA 3 3.1
V
V
CC
=
4
.
5
V
I
OH
= –12 mA 2.6 2.6
V
OL
V
CC
=45V
I
OL
= 8 mA 0.65 0.8 0.65
V
V
OL
V
CC
=
4
.
5
V
I
OL
= 12 mA 0.8 0.8
V
V
hys
100 mV
I
I
Control
inputs
V
CC
= 0 to 5.5 V, V
I
= V
CC
or GND ±1 ±1 ±1
µA
I
I
A or B ports
V
CC
= 2.1 V to 5.5 V,
V
I
= V
CC
or GND
±20 ±20 ±20
µ
A
I
OZH
‡
V
CC
= 2.1 V to 5.5 V, V
O
= 2.7 V,
OE
≥ 2 V
10 10 10 µA
I
OZL
‡
V
CC
= 2.1 V to 5.5 V, V
O
= 0.5 V,
OE
≥ 2 V
–10 –10 –10 µA
I
OZPU
§
V
CC
= 0 to 2.1 V, V
O
= 0.5 V to 2.7 V,
OE
= X
±50 ±50 ±50 µA
I
OZPD
§
V
CC
= 2.1 V to 0, V
O
= 0.5 V to 2.7 V,
OE
= X
±50 ±50 ±50 µA
I
off
V
CC
= 0, V
I
or V
O
≤ 4.5 V ±100 ±100 µA
I
CEX
V
CC
= 5.5 V,
V
O
= 5.5 V
Outputs high 50 50 50 µA
I
O
¶
V
CC
= 5.5 V, V
O
= 2.5 V –25 –100 –25 –100 –25 –100 mA
V
CC
=
5.5 V,
Outputs high 1 250 250 250 µA
I
CC
A or B ports
V
CC
=
5
.
5
V
,
I
O
= 0,
Outputs low 24 32 32 32 mA
V
I
= V
CC
or GND
Outputs disabled 0.5 250 250 250 µA
Data in
p
uts
V
CC
= 5.5 V,
One input at 3.4 V,
Outputs enabled 1.5 1.5 1.5
∆I
CC
#
Data
inp
u
ts
,
Other inputs at
V
CC
or GND
Outputs disabled 0.05 0.05 0.05
mA
Control
inputs
V
CC
= 5.5 V, One input at 3.4 V,
Other inputs at V
CC
or GND
1.5 1.5 1.5
C
i
V
I
= 2.5 V or 0.5 V 3 pF
C
io
V
O
= 2.5 V or 0.5 V 6 pF
* On products compliant to MIL-PRF–38535, this parameter does not apply.
†
All typical values are at V
CC
= 5 V.
‡
The parameters I
OZH
and I
OZL
include the input leakage current.
§
This parameter is characterized but not production tested.
¶
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
#
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.