Datasheet
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A
SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996
28
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN74ABTH18502A
PARAMETER TEST CONDITIONS
T
A
= 25°C T
A
= –40°C to 85°C
UNIT
MIN TYP
†
MAX MIN MAX
V
IK
V
CC
= 4.5 V, I
I
= –18 mA –1.2 –1.2 V
V
CC
= 4.5 V, I
OH
= –3 mA 2.5 2.5
V
OH
V
CC
= 5 V, I
OH
= –3 mA 3 3
V
V
OH
V
CC
=45V
I
OH
= –24 mA 2
V
V
CC
=
4
.
5
V
I
OH
= –32 mA 2 2
V
OL
V
CC
=45V
I
OL
= 48 mA 0.55
V
V
OL
V
CC
=
4
.
5
V
I
OL
= 64 mA 0.55 0.55
V
I
I
CLK, LE, TCK V
CC
= 0 to 5.5 V, V
I
= V
CC
or GND ±1 ±1
µA
I
I
A or B ports V
CC
= 5.5 V, V
I
= V
CC
or GND ±20 ±20
µ
A
I
IH
OE, TDI, TMS V
CC
= 5.5 V, V
I
= V
CC
10 10 µA
I
IL
OE, TDI, TMS V
CC
= 5.5 V, V
I
= GND –40 –150 –40 –150 µA
I
‡
AorB
p
orts
V
CC
=45V
V
I
= 0.8 V 75 220 500 75 500
µA
I
I(hold)
‡
A
or
B
ports
V
CC
=
4
.
5
V
V
I
= 2 V –75 –180 –500 –75 –500
µ
A
I
OZH
TDO
V
CC
= 2.1 V to 5.5 V,
V
O
= 2.7 V, OE
= 2 V
10 10 µA
I
OZL
TDO
V
CC
= 2.1 V to 5.5 V,
V
O
= 0.5 V, OE
= 2 V
–10 –10 µA
I
OZPU
TDO
V
CC
= 0 to 2.1 V,
V
O
= 2.7 V or 0.5 V, OE
= 0.8 V
±50 ±50 µA
I
OZPD
TDO
V
CC
= 2.1 V to 0,
V
O
= 2.7 V or 0.5 V, OE
= 0.8 V
±50 ±50 µA
I
off
V
CC
= 0, V
I
or V
O
≤ 4.5 V ±100 ±100 µA
I
CEX
Outputs high V
CC
= 5.5 V, V
O
= 5.5 V 50 50 µA
I
O
§
V
CC
= 5.5 V, V
O
= 2.5 V –50 –110 –200 –50 –200 mA
Outputs high
V
CC
=
5.5 V,
1.6 2.2 2.2
I
CC
Outputs low
V
CC
=
5
.
5
V
,
I
O
= 0,
A or B ports
19 24 24
mA
Outputs disabled
V
I
= V
CC
or GND
0.9 2 2
∆I
CC
¶
V
CC
= 5.5 V, One input at 3.4 V,
Other inputs at V
CC
or GND
1.5 1.5 mA
C
i
Control inputs V
I
= 2.5 V or 0.5 V 5 pF
C
io
A or B ports V
O
= 2.5 V or 0.5 V 10 pF
C
o
TDO V
O
= 2.5 V or 0.5 V 8 pF
†
All typical values are at V
CC
= 5 V.
‡
The parameter I
I(hold)
includes the off-state output leakage current.
§
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
¶
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.