Datasheet

SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
21
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 14)
SN54ABT8652 SN74ABT8652
UNIT
MIN MAX MIN MAX
UNIT
f
clock
Clock frequency CLKAB or CLKBA 0 100 0 100 MHz
t
w
Pulse duration CLKAB or CLKBA high or low 3 3 ns
t
su
Setup time A before CLKAB or B before CLKBA 5.1 4.5 ns
t
h
Hold time A after CLKAB or B after CLKBA 0.5 0 ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 14)
SN54ABT8652 SN74ABT8652
UNIT
MIN MAX MIN MAX
UNIT
f
clock
Clock frequency TCK 0 50 0 50 MHz
t
w
Pulse duration TCK high or low 5 5 ns
A, B, CLK, OEAB, OEBA, or S before TCK 5.1 5
t
su
Setup time
TDI before TCK
6 6
ns
TMS before TCK 6 6
A, B, CLK, OEAB, OEBA, or S after TCK 0.6 0
t
h
Hold time
TDI after TCK
0.9 0
ns
TMS after TCK 0.9 0
t
d
Delay time Power up to TCK 50* 50 ns
t
r
Rise time V
CC
power up 1* 1 µs
* On products compliant to MIL-PRF-38535, this parameter is not production tested.