Datasheet

SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1–A8 Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B8 Normal-function B-bus I/O ports. See function table for normal-mode logic.
DIR Normal-function direction-control input. See function table for normal-mode logic.
GND Ground
OE Normal-function output-enable input. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to TCK.
Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through the
instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data through
the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS input directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
V
CC
Supply voltage