Datasheet
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
25
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
T
A
= 25°C SN54ABT18245A SN74ABT18245A
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP
†
MAX MIN MAX MIN MAX
UNIT
V
IK
V
CC
= 4.5 V, I
I
= –18 mA –1.2 –1.2 –1.2 V
V
CC
= 4.5 V, I
OH
= –3 mA 2.5 2.5 2.5
V
OH
V
CC
= 5 V, I
OH
= –3 mA 3 3 3
V
V
OH
V
CC
= 4.5 V, I
OH
= –24 mA 2 2
V
V
CC
= 4.5 V, I
OH
= –32 mA 2* 2
V
OL
V
CC
=45V
I
OL
= 48 mA 0.55 0.55
V
V
OL
V
CC
=
4
.
5
V
I
OL
= 64 mA 0.55* 0.55
V
I
I
V
CC
= 5.5 V,
DIR, OE, TCK ±1 ±1 ±1
µA
I
I
CC
,
V
I
= V
CC
or GND
A or B ports ±100 ±100 ±100
µ
A
I
IH
V
CC
= 5.5 V,
V
I
= V
CC
TDI, TMS 10 10 10 µA
I
IL
V
CC
= 5.5 V,
V
I
= GND
TDI, TMS –40 –150 –40 –150 –40 –150 µA
I
OZH
‡
V
CC
= 5.5 V, V
O
= 2.7 V 50 50 50 µA
I
OZL
‡
V
CC
= 5.5 V, V
O
= 0.5 V –50 –50 –50 µA
I
OZPU
V
CC
= 0 to 2 V,
V
O
= 2.7 V or 0.5 V
OE = 0.8 V
±50 ±50 ±50 µA
I
OZPD
V
CC
= 2 V to 0,
V
O
= 2.7 V or 0.5 V
OE = 0.8 V
±50 ±50 ±50 µA
I
off
V
CC
= 0, V
I
or V
O
≤ 4.5 V ±100 ±450 ±100 µA
I
CEX
V
CC
= 5.5 V,
V
O
= 5.5 V
Outputs high 50 50 50 µA
I
O
§
V
CC
= 5.5 V, V
O
= 2.5 V –50 –110 –200 –50 –200 –50 –200 mA
V
CC
=
5.5 V,
Aor
Outputs high 3.5 5 5 5
I
CC
V
CC
=
5
.
5
V
,
I
O
= 0,
A
or
B
Outputs low 33 38 38 38
mA
V
I
= V
CC
or GND ports
Outputs disabled 2.9 4.5 4.5 4.5
∆I
¶
V
CC
= 5.5 V, One input at 3.4 V,
50
50
50
µA
∆I
CC
¶
CC
,,
Other inputs at V
CC
or GND
50
50
50
µ
A
C
i
V
I
= 2.5 V or 0.5 V Control inputs 3 9.8 pF
C
io
V
O
= 2.5 V or 0.5 V A or B ports 10 12.6 pF
C
o
V
O
= 2.5 V or 0.5 V TDO 8 11.4 pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
†
All typical values are at V
CC
= 5 V.
‡
The parameters I
OZH
and I
OZL
include the input leakage current.
§
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
¶
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.