Datasheet

C
L
= 10 pF Max
(2 Places)
49.9 Ω ± 1% (2 Places)
V
OC
V
OD
YP
YM
V
OD(H)
V
OC(SS)
V
OC(SS)
V
OD(L)
100%
80%
20%
0%
0 V
V
OC(PP)
t
r
t
f
0 V
(a) SCHEMATIC
(b) WAVEFORMS
NOTE A: The lumped instrumentation capacitance for any
single-ended voltage measurement is less than or equal
to 10 pF. When making measurements at YP or YM, the
complementary output is similarly loaded.
t
c
NOTE A: The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs. Pattern with
CLKSEL low shown.
CLKIN
Even Dn
Odd Dn
SN65LVDS93
www.ti.com ................................................................................................................................................................. SLLS302G – MAY 1998 – REVISED MAY 2009
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 3. Test Load and Voltage Definitions for LVDS Outputs
Figure 4. Worst-Case Test Pattern (CLKSEL Low Shown)
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