Datasheet

SN65LVDS315
SLLS881F –DECEMBER 2007–REVISED SEPTEMBER 2012 www.ti.com
Typical Blanking Power Consumption Test Pattern
During blanking VS is low, and the SN65LVDS315 data output DOUT presents a high signal. The typical power
consumption test patterns during the blanking time consists of one data word. The pattern repeats itself
throughout the entire measurement.
Table 6. Typical IC Power Consumption Test During
Blanking
TEST PATTERN
WORD
D[7:0] VS HS
1 0x00 0 x
Maximum Power Consumption Test Pattern
The maximum (or worst-case) power consumption of the SN65LVDS315 is tested using an alternating 1010 test
pattern. The pattern repeats itself throughout the entire measurement.
Table 7. Worst Case IC Power Consumption Test
Pattern 1
TEST PATTERN
WORD
D[7:0] VS HS
1 0x00 1 1
2 0xFF 1 1
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