Datasheet

V
ID
V
O
10 pF,
2 Places
15 pF
100
1000
1000
100
V
IC
V
ID
V
O
V
ID
V
O
V
IT+
0 V
−100 mV
100 mV
0 V
V
IT−
Remove for testing LVDT device.
NOTE: Input signal of 3 Mpps, duration of 167 ns, and transition time of < 1 ns.
NOTE: Input signal of 3 Mpps, duration of 167 ns, and transition time of <1 ns.
+
SN65LVDS1
SN65LVDS2
SN65LVDT2
SLLS373K JULY 1999 REVISED NOVEMBER 2008 ....................................................................................................................................................
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 4. V
IT+
and V
IT-
Input Voltage Threshold Test Circuit and Definitions
8 Submit Documentation Feedback Copyright © 1999 2008, Texas Instruments Incorporated
Product Folder Link(s): SN65LVDS1 SN65LVDS2 SN65LVDT2