Datasheet
SN65LVDT125A
SN65LVDS125A
SLLS595C –OCTOBER 2003– REVISED JUNE 2011
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Table 1. CROSSPOINT LOGIC TABLES
OUTPUT CHANNEL 1 OUTPUT CHANNEL 2 OUTPUT CHANNEL 3 OUTPUT CHANNEL 4
CONTROL INPUT CONTROL INPUT CONTROL INPUT CONTROL INPUT
PINS SELECTED PINS SELECTED PINS SELECTED PINS SELECTED
S10 S11 1Y/1Z S20 S21 2Y/2Z S30 S31 3Y/3Z S40 S41 4Y/4Z
0 0 1A/1B 0 0 1A/1B 0 0 1A/1B 0 0 1A/1B
0 1 2A/2B 0 1 2A/2B 0 1 2A/2B 0 1 2A/2B
1 0 3A/3B 1 0 3A/3B 1 0 3A/3B 1 0 3A/3B
1 1 4A/4B 1 1 4A/4B 1 1 4A/4B 1 1 4A/4B
PACKAGE DISSIPATION RATINGS
CIRCUIT BOARD T
A
≤ 25°C DERATING FACTOR
(1)
T
A
= 85°C
PACKAGE
MODEL POWER RATING ABOVE T
A
= 25°C POWER RATING
TSSOP (DBT) High-K
(2)
1772 mW 15.4 mW/°C 847 mW
(1) This is the inverse of the junction-to-ambient thermal resistance when board-mounded and with no air flow.
(2) In accordance with the High-K thermal metric definitions of EIA/JESD51-6.
THERMAL CHARACTERISTICS
PARAMETER TEST CONDITIONS VALUE UNITS
θ
JB
Junction-to-board thermal resistance 40.3
°C/W
θ
JC
Junction-to-case thermal resistance 8.5
Typical V
CC
= 3.3 V, T
A
= 25°C, 750 MHz 356 mW
P
D
Device power dissipation
Maximum V
CC
= 3.6 V, T
A
= 85°C, 750 MHz 522 mW
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1)
UNITS
Supply voltage range, V
cc
-0.5 V to 4 V
S, DE -0.5 V to 4 V
(A, B) -0.5 V to 4 V
Voltage range
(2)
|V
A
- V
B
| (LVDT only) 1 V
(Y, Z) -0.5 V to 4 V
Human body model
(3)
All pins ±3 kV
Electrostatic discharge
Charged-device model
(4)
All pins ±500 V
Continuous power dissipation See Dissipation Rating Table
Storage temperature range -65°C to 150°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4) Tested in accordance with JEDEC Standard 22, Test Method C101.
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