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SERIALIZER SWITCHING CHARACTERISTICS
DESERIALIZER TIMING REQUIREMENTS FOR REFCLK
DESERIALIZER SWITCHING CHARACTERISTICS
SN65LV1021
SN65LV1212
SLLS526G FEBRUARY 2002 REVISED DECEMBER 2005
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
TLH(L)
LVDS low-to-high transition time 0.2 1
R
L
= 27 , C
L
= 10 pF to GND, See
Figure 4
t
THL(L)
LVDS high-to-low transition time 0.25 1
t
su(DI)
D
IN0
-D
IN9
setup to TCLK 1 0
R
L
= 27 , C
L
= 10 pF to GND, See
Figure 7
t
h(D)
D
IN0
-D
IN9
hold from TCLK 6.5 4.5
DO± high-to-high impedance
t
d(HZ)
2.5 5
state delay
DO± low-to-high impedance state
t
d(LZ)
2.5 5
delay
R
L
= 27 , C
L
= 10 pF to GND, See
Figure 8
ns
DO± high-impedance
t
d(ZH)
2.5 10
state-to-high delay
DO± high-impedance state-to-low
t
d(ZL)
2.7 10
delay
t
w(SP)
SYNC pulse duration 6×t
TCP
R
L
= 27 , See Figure 9
andFigure 10
t
PLD
Serializer PLL lock time 1026×t
TCP
t
d(S)
Serializer delay R
L
= 27 , See Figure 11
t
(BIT)
Bus LVDS bit width R
L
= 27 , C
L
= 10 pF to GND t
CLK
/12
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
RFCP
REFCLK period 25 T 100 ns
t
RFDC
REFCLK duty cycle 40% 50% 60%
t
t(RF)
REFCLK transition time 3 6 ns
Frequency tolerance -100 +100 ppm
over recommended operating supply and temperature ranges (unless otherwise specified)
TEST
PARAMETER PIN/FREQ MIN TYP MAX UNIT
CONDITIONS
t
(RCP)
= t
(TCP)
t
RCP
Receiver out clock period RCLK 25 100
See Figure 11
CMOS/TTL low-to-high transition
t
TLH(C)
0.7 2.5
R
OUT0
-
time
C
L
=15 pF,
R
OUT9
, LOC
ns
See Figure 5
CMOS/TTL high-to-low transition
K, RCLK
t
THL(C)
1.1 2.5
time
10 MHz 2×t
RCP
+ 9 2.833×t
RCP
+ 14
Room temperature,
t
d(D)
Deserializer delay, See Figure 12
3.3 V
40 MHz 2×t
RCP
+ 6 2.833×t
RCP
+ 10
t
su(ROS)
R
OUT0
-R
OUT9
setup data to RCLK 0.4×t
RCP
0.5×t
RCP
ns
t
(ROH)
R
OUT0
-R
OUT9
hold data to RCLK See Figure 13 RCLK -0.4×t
RCP
-0.5×t
RCP
t
(RDC)
RCLK duty cycle 40% 50% 60%
High-to-high impedance state
t
d(HZ)
6.7 8
delay
Low-to-high impedance state
t
d(LZ)
4.6 8
R
OUT0
-
delay
See Figure 14 R
OUT9
, ns
High-impedance state-to-high
LOCK
t
d(ZH)
5.5 8
delay
High-impedance state-to-low
t
d(ZL)
4.8 8
delay
9