Datasheet

SN65LBC174A
SN75LBC174A
SLLS446F –OCTOBER 2000–REVISED OCTOBER 2009 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION (CONTINUED)
Each driver features current limiting and thermal-shutdown circuitry making it suitable for high-speed multipoint
applications in noisy environments. These devices are designed using LinBiCMOS
®
, facilitating low power
consumption and robustness.
The two EN inputs provide pair-wise driver enabling, or can be externally tied together to provide enable control
of all four drivers with one signal. When disabled or powered off, the driver outputs present a high-impedance to
the bus for reduced system loading.
The SN75LBC174A is characterized for operation over the temperature range of 0°C to 70°C. The
SN65LBC174A is characterized for operation over the temperature range of –40°C to 85°C.
Table 1. AVAILABLE OPTIONS
PACKAGE
16-PIN 20-PIN 16-PIN
T
A
PLASTIC SMALL OUTLINE
(1)
PLASTIC SMALL OUTLINE
(1)
PLASTIC THROUGH-HOLE
(JEDEC MS-013) (JEDEC MS-013) (JEDEC MS-001)
SN75LBC174A16DW SN75LBC174ADW SN75LBC174AN
0°C to 70°C
MARKED AS 75LBC174A
SN65LBC174A16DW SN65LBC174DW SN65LBC174AN
–40°C to 85°C
MARKED AS 65LBC174A
(1) Add R suffix for taped and reeled version.
Table 2. FUNCTION TABLE (EACH DRIVER)
(1)
INPUT ENABLE OUTPUT OUTPUT
A EN Y Z
L H L H
H H H L
OPEN H H L
L OPEN L H
H OPEN H L
OPEN OPEN H L
X L Z Z
(1) H = high level, L = low level, X = irrelevant, Z = high impedance (off)
2 Submit Documentation Feedback Copyright © 2000–2009, Texas Instruments Incorporated
Product Folder Link(s): SN65LBC174A SN75LBC174A