Datasheet
+
_
DUT
TXD
STB
RXD
15 pF 20%±
V
O
V
I
0 V C
L
60 W
± 1%
CANH
CANL
50 %
50 %
t
en
V
IO
0 V
V
OL
V
I
V
O
V
IO
CANH
CANL
TXD
STB
V
I
V
O(CANH)
V
OC(SS)
R
L
V
O(CANL)
V =
OC
2
V + V
O(CANH) O(CANL)
V
OC
SN65HVDA540
SN65HVDA541
www.ti.com
........................................................................................................................................................................................................ SLLS981 – MAY 2009
Differential Input Voltage Threshold Test
INPUT OUTPUT
V
CANH
V
CANL
|V
ID
| R
– 11.1 V – 12 V 900 mV L
12 V 11.1 V 900 mV L
V
OL
– 6 V – 12 V 6 V L
12 V 6 V 6 V L
– 11.5 V – 12 V 500 mV H
12 V 11.5 V 500 mV H
– 12 V – 6 V 6 V H V
OH
6 V 12 V 6 V H
Open Open X H
A. C
L
= 100 pF includes instrumentation and fixture capacitance within ± 20%.
B. All V
I
input pulses are from 0 V to V
IO
and supplied by a generator having the following characteristics: t
r
or t
f
≤ 6 ns.
Pulse Repetition Rate (PRR) = 25 kHz, 50% duty cycle.
Figure 9. t
en
Test Circuit and Waveforms
A. All V
I
input pulses are from 0 V to V
IO
and supplied by a generator having the following characteristics: t
r
or t
f
≤ 6 ns.
Pulse Repetition Rate (PRR) = 125 kHz, 50% duty cycle.
Figure 10. Common-Mode Output Voltage Test and Waveforms
Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 11
Product Folder Link(s): SN65HVDA540 SN65HVDA541