Datasheet

SN65HVD82
SLLSED6 –OCTOBER 2012 www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DRIVER FUNCTION TABLE
INPUT ENABLE OUTPUTS
D DE A B
H H H L Actively drive bus High
L H L H Actively drive bus Low
X L Z Z Driver disabled
X OPEN Z Z Driver disabled by default
OPEN H H L Actively drive bus High by default
RECEIVER FUNCTION TABLE
DIFFERENTIAL INPUT ENABLE OUTPUT
V
ID
= V
A
– V
B
RE R
V
IT+
< V
ID
L H Receive valid bus High
V
IT–
< V
ID
< V
IT+
L ? Indeterminate bus state
V
ID
< V
IT–
L L Receive valid bus Low
X H Z Receiver disabled
X OPEN Z Receiver disabled by default
Open-circuit bus L H Fail-safe high output
Short-circuit bus L H Fail-safe high output
Idle (terminated) bus L H Fail-safe high output
ABSOLUTE MAXIMUM RATINGS
(1)
VALUE
UNIT
MIN MAX
V
CC
Supply voltage –0.5 7 V
Voltage range at A or B Inputs –18 18 V
Input voltage range at any logic pin –0.3 5.7 V
Voltage input range, transient pulse, A and B, through 100Ω –100 100 V
Receiver output current –24 24 mA
T
J
Junction temperature 170 °C
T
STG
Storage temperature –65 150 °C
Continuous total power dissipation See Thermal Table
IEC 61000-4-2 ESD (Contact Discharge), bus terminals and GND ±12 kV
IEC 60749-26 ESD (Human Body Model), bus terminals and GND ±16 kV
IEC 61000-4-4 EMC (Fast Transient Burst Immunity), bus terminals and GND ±4 kV
JEDEC Standard 22, Test Method A114 (Human Body Model), all pins ±4 kV
JEDEC Standard 22, Test Method C101 (Charged Device Model), all pins ±1.5 kV
JEDEC Standard 22, Test Method A115 (Machine Model), all pins ±100 V
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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