Datasheet

60 Ω ±1%
V
OD
0or3V
_
+
−7V<V
(test)
<12V
DE
V
CC
Y
Z
D
375 Ω ±1%
375 Ω ±1%
I
Y
V
OD R
L
0or3V
V
Y
V
Z
I
Z
DE
V
CC
I
I
V
I
Y
Z
SN65HVD50-SN65HVD55
SLLS666E –SEPTEMBER 2005–REVISED OCTOBER 2009 www.ti.com
THERMAL CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
(1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Low-K board
(3)
, No airflow HVD50, HVD51, HVD52 230.8
Junction−to−ambient
thermal resistance
(2)
HVD53, HVD54, HVD55 162.6
θ
JA
High-K board
(4)
, No airflow HVD50, HVD51, HVD52 135.1
Junction−to−ambient
thermal resistance
(2)
HVD53, HVD54, HVD55 92.1
°C/W
HVD50, HVD51, HVD55 44.4
Junction−to−board
θ
JB
High-K board
thermal resistance
HVD53, HVD54, HVD55 61.1
HVD50, HVD51, HVD52 43.5
Junction−to−case
θ
JC
No board
thermal resistance
HVD53, HVD54, HVD55 58.6
HVD50 (25Mbps) 420
R
L
= 60Ω, C
L
= 50 pF,
Input to D a 50% duty cycle square HVD51 (10Mbps) 404
wave at indicated signaling rate
HVD52 (1Mbps) 383
P
D
Device power dissipation mW
R
L
= 60Ω, C
L
= 50 pF, HVD53 (25Mbps) 420
DE at V
CC
RE at 0 V,
HVD54 (10Mbps) 404
Input to D a 50% duty cycle square
HVD55 (1Mbps) 383
wave at indicated signaling rate
HVD50 –40 55
Low-K board, No airflow HVD51, HVD52 –40 84
T
A
Ambient air temperature HVD53, HVD54, HVD55 –40 85
°C
HVD50, HVD51, HVD52 –40 85
High-K board, No airflow
HVD53, HVD54, HVD55 –40 85
T
JSD
Thermal shutdown junction temperature 165
(1) See Application Information section for an explanation of these parameters.
(2) The intent of θ
JA
specification is solely for a thermal performance comparison of one package to another in a standardized environment.
This methodology is not meant to and will not predict the performance of a package in an application-specific environment.
(3) In accordance with the Low-K thermal metric definitions of EIA/JESD51-3.
(4) In accordance with the High-K thermal metric definitions of EIA/JESD51-7.
PARAMETER MEASUREMENT INFORMATION
Figure 1. Driver V
OD
Test Circuit: Voltage and Figure 2. Driver V
OD
With Common-Mode Loading
Current Definitions Test Circuit
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