Datasheet
R
D
B
A
Z
Y
7
8
6
5
2
3
DP (TOP VIEW)ACKAGE
1
2
3
4
8
7
6
5
R
D
V
CC
B
A
Z
Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
NC
R
RE
DE
D
GND
GND
V
CC
V
CC
A
B
Z
Y
NC
NC-Nointernalconnection
SN65HVD50-SN65HVD55
SLLS666E –SEPTEMBER 2005–REVISED OCTOBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SN65HVD50, SN65HVD51, SN65HVD52 SN65HVD53, SN65HVD54, SN65HVD55
AVAILABLE OPTIONS
BASE
SIGNALING RATE UNIT LOADS ENABLES SOIC MARKING
PART NUMBER
25 Mbps 1/2 No SN65HVD50 65HVD50
5 Mbps 1/8 No SN65HVD51 65HVD51
1 Mbps 1/8 No SN65HVD52 65HVD52
25 Mbps 1/2 Yes SN65HVD53 65HVD53
5 Mbps 1/8 Yes SN65HVD54 65HVD54
1 Mbps 1/8 Yes SN65HVD55 65HVD55
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1) (2)
UNIT
V
CC
Supply voltage range –0.3 V to 6 V
V
(A)
, V
(B)
, V
(Y)
, V
(Z)
Voltage range at any bus terminal (A, B, Y, Z) –9 V to 14 V
V
(TRANS)
Voltage input, transient pulse through 100 Ω. See Figure 12 (A, B, Y, Z)
(3)
–50 to 50 V
V
I
Voltage input range (D, DE, RE) -0.5 V to 7 V
P
D(cont)
Continuous total power dissipation Internally limited
(4)
I
O
Output current (receiver output only, R) 11 mA
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) This tests survivability only and the output state of the receiver is not specified.
(4) The thermal shutdown typically occurs when the junction temperature reaches 165°C.
2 Submit Documentation Feedback Copyright © 2005–2009, Texas Instruments Incorporated
Product Folder Link(s) :SN65HVD50-SN65HVD55