Datasheet

PARAMETER MEASUREMENT INFORMATION
60 ±1%
V
OD
0Vor3V
_
+
−7V<V
(test)
<12V
Y
Z
D
375 ±1%
375 ±1%
I
Y
V
OD R
L
0Vor3V
V
Y
V
Z
I
Z
I
I
V
I
Y
Z
V
OD(RING)
V
OD(RING)
–V
OD(SS)
V
OD(SS)
0VDifferential
V
OC
27 ±1%
Input
Y
Z
V
Y
V
Z
V
OC(PP)
∆V
OC(SS)
V
OC
27 ±1%
C
L
=50pF ±20%
D
Y
Z
C
L
IncludesFixtureand
InstrumentationCapacitance
Input:PRR=500kHz,50%DutyCycle,t <6ns,t <6ns,Z =50
r f O
W
SN65HVD379
www.ti.com
.................................................................................................................................................... SLLS667B FEBRUARY 2006 REVISED JUNE 2008
Figure 1. Driver V
OD
Test Circuit and Voltage and Figure 2. Driver V
OD
With Common-Mode Loading Test
Current Definitions Circuit
Figure 3. V
OD(RING)
Waveform and Definitions
V
OD(RING)
is measured at four points on the output waveform, corresponding to overshoot and undershoot from
theV
OD(H)
and V
OD(L)
steady state values.
Figure 4. Test Circuit and Definitions for the Driver Common-Mode Output Voltage
Copyright © 2006 2008, Texas Instruments Incorporated Submit Documentation Feedback 5
Product Folder Link(s): SN65HVD379