Datasheet

I
Y
V
OD R
L
0or3V
V
Y
V
Z
I
Z
DE
V
CC
I
I
V
I
Y
Z
60 ±1%
V
OD
0or3V
_
+
−7V<V
(test)
<12V
DE
V
CC
Y
Z
D
375 ±1%
375 ±1%
V
OD(RING)
V
OD(RING)
–V
OD(SS)
V
OD(SS)
0VDifferential
V
OC
27 ± 1%
Input
Y
Z
V
Y
V
Z
V
OC(PP)
∆V
OC(SS)
V
OC
27 ± 1%
C
L
=50pF ±20%
D
Y
Z
DE
V
CC
SN65HVD30-EP, SN65HVD31-EP, SN65HVD32-EP
SN65HVD33-EP, SN65HVD34-EP, SN65HVD35-EP
www.ti.com
SGLS367D SEPTEMBER 2006REVISED MARCH 2012
PARAMETER MEASUREMENT INFORMATION
Figure 1. Driver V
OD
Test Circuit and Voltage and Current Definitions
Figure 2. Driver V
OD
With Common-Mode Loading Test Circuit
Figure 3. V
OD(RING)
Waveform and Definitions
V
OD(RING)
is measured at four points on the output waveform, corresponding to overshoot and undershoot from
the V
OD(H)
and V
OD(L)
steady state values.
Input: PRR = 500 kHz, 50% Duty Cycle, t
r
< 6 ns, t
f
< 6 ns, Z
O
= 50
Figure 4. Test Circuit and Definitions for Driver Common-Mode Output Voltage
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SN65HVD35-EP