Datasheet

Junction
PCBoard
q
JB
Calculated/Measured
SurfaceNode
AmbientNode
q
CA
Calculated
q
JC
Calculated/Measured
SN65HVD3082E, SN75HVD3082E
SN65HVD3085E, SH65HVD3088E
www.ti.com SLLS562G –AUGUST 2009–REVISED MAY 2009
THERMAL CHARACTERISTICS OF IC PACKAGES
θ
JA
(Junction-to-Ambient Thermal Resistance) is defined as the difference in junction temperature to ambient
temperature divided by the operating power.
θ
JA
is NOT a constant and is a strong function of:
• the PCB design (50% variation)
• altitude (20% variation)
• device power (5% variation)
θ
JA
can be used to compare the thermal performance of packages if the specific test conditions are defined and
used. Standardized testing includes specification of PCB construction, test chamber volume, sensor locations,
and the thermal characteristics of holding fixtures. θ
JA
is often misused when it is used to calculate junction
temperatures for other installations.
TI uses two test PCBs as defined by JEDEC specifications. The low-k board gives average in-use condition
thermal performance and consists of a single trace layer 25 mm long and 2-oz thick copper. The high-k board
gives best case in–use condition and consists of two 1–oz buried power planes with a single trace layer 25 mm
long with 2-oz thick copper. A 4% to 50% difference in θ
JA
can be measured between these two test cards.
θ
JC
(Junction-to-Case Thermal Resistance) is defined as difference in junction temperature to case divided by the
operating power. It is measured by putting the mounted package up against a copper block cold plate to force
heat to flow from die, through the mold compound into the copper block.
θ
JC
is a useful thermal characteristic when a heatsink is applied to package. It is NOT a useful characteristic to
predict junction temperature as it provides pessimistic numbers if the case temperature is measured in a non-
standard system and junction temperatures are backed out. It can be used with θ
JB
in 1-dimensional thermal
simulation of a package system.
θ
JB
(Junction-to-Board Thermal Resistance) is defined to be the difference in the junction temperature and the
PCB temperature at the center of the package (closest to the die) when the PCB is clamped in a cold−plate
structure. θ
JB
is only defined for the high-k test card.
θ
JB
provides an overall thermal resistance between the die and the PCB. It includes a bit of the PCB thermal
resistance (especially for BGA’s with thermal balls) and can be used for simple 1-dimensional network analysis of
package system (see Figure 22).
Figure 22. Thermal Resistance
Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 15
Product Folder Link(s): SN65HVD3082E SN75HVD3082E SN65HVD3085E SH65HVD3088E