Datasheet

SN65HVD255
SN65HVD256, SN65HVD257
www.ti.com SLLSEA2C –DECEMBER 2011–REVISED SEPTEMBER 2013
ABSOLUTE MAXIMUM RATINGS
(1)(2)
1.0 RATING UNIT
1.1 V
CC
Supply voltage range –0.3 to 6 V
1.2 V
RXD
RXD Output supply voltage range SN65HVD256 –0.3 to 6 and V
RXD
≤ V
CC
+ 0.3 V
1.3 V
BUS
CAN Bus I/O voltage range (CANH, CANL) –27 to 40 V
1.4 V
Logic_Input
Logic input pin voltage range (TXD, S) –0.3 to 6 V
1.5 V
Logic_Output
Logic output pin voltage range (RXD) SN65HVD255, SN65HVD257 –0.3 to 6 V
1.6 V
Logic_Output
Logic output pin voltage range (RXD) SN65HVD256 –0.3 to 6 and V
I
≤ V
RXD
+ 0.3 V
1.7 I
O(RXD)
RXD (Receiver) output current 12 mA
1.8 I
O(FAULT)
FAULT output current SN65HVD257 20 mA
Operating virtual junction temperature range (see THERMAL
1.9 T
J
–40 to 150 °C
CHARACTERISTICS)
1.10 T
A
Ambient temperature range (see THERMAL CHARACTERISTICS) –40 to 125 °C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal.
TRANSIENT AND ELECTROSTATIC DISCHARGE PROTECTION
2.0 TEST CONDITIONS RATING UNIT
All pins
(1)
±2.5
2.1 Human-Body Model kV
CAN bus pins (CANH, CANL)
(2)
±12
2.2 Charged-Device Model All pins
(3)
±750 V
2.3 Machine Model All pins
(4)
±250 V
IEC 61400-4-2 according to GIFT-ICT CAN EMC test
2.4 CAN bus pins (CANH, CANL) to GND ±8 kV
spec
(5)
2.5 Pulse 1 –100 V
2.6 Pulse 2 +75 V
ISO7637 Transients according to GIFT - ICT CAN CAN bus pins
EMC test spec
(6)
(CANH, CANL)
2.7 Pulse 3a –150 V
2.8 Pulse 3b +100 V
(1) Tested in accordance to JEDEC Standard 22, Test Method A114.
(2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus pins stressed with respect to GND.
(3) Tested in accordance to JEDEC Standard 22, Test Method C101.
(4) Tested in accordance to JEDEC Standard 22, Test Method A115.
(5) IEC 61000-4-2 is a system level ESD test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions.
Different system level configurations may lead to different results.
(6) ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions.
Different system level configurations may lead to different results.
RECOMMENDED OPERATING CONDITIONS
3.0 MIN MAX UNIT
3.1 V
CC
Supply voltage 4.5 5.5
3.2 V
RXD
RXD supply (SN65HVD256 only) 2.8 5.5
3.3 V
I
or V
IC
CAN bus terminal voltage (separately or common mode) –2 7
V
3.4 V
ID
CAN bus differential voltage -6 6
3.5 V
IH
Logic HIGH level input (TXD, S) 2 5.5
3.6 V
IL
Logic LOW level input (TXD, S) 0 0.8
3.7 I
OH(DRVR)
CAN BUS Driver High level output current –70
3.8 I
OL(DRVR)
CAN BUS Driver Low level output current 70
3.9 I
OH(RXD)
RXD pin HIGH level output current –2 mA
3.10 I
OL(RXD)
RXD pin LOW level output current 2
3.11 I
O(FAULT)
FAULT pin LOW level output current SN65HVD257 2
3.12 T
A
Operational free-air temperature (see THERMAL CHARACTERISTICS) –40 125 °C
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