Datasheet
SN65HVD20, SN65HVD21
SN65HVD22, SN65HVD23, SN65HVD24
www.ti.com
SLLS552E –DECEMBER 2002–REVISED MAY 2010
Table 1. DRIVER FUNCTION TABLE
HVD20, HVD21, HVD22 HVD23, HVD24
INPUT ENABLE OUTPUTS INPUT ENABLE OUTPUTS
D D
DE A B DE A B
H H H L H H H L
L H L H L H L H
X L Z Z X L Z Z
X OPEN Z Z X OPEN Z Z
OPEN H H L OPEN H L H
H = high level, L= low level, X = don’t care, Z = high impedance (off), ? = indeterminate
Table 2. RECEIVER FUNCTION TABLE
DIFFERENTIAL INPUT ENABLE OUTPUT
V
ID
= (V
A
– V
B
) RE R
0.2 V ≤ VID L H
–0.2 V < VID < 0.2 V L H (see Note
(1)
)
VID ≤ –0.2 V L L
X H Z
X OPEN Z
Open circuit L H
Short Circuit L H
Idle (terminated) bus L H
H = high level, L= low level, Z = high impedance (off)
(1) If the differential input V
ID
remains within the transition range for
more than 250 µs, the integrated failsafe circuitry detects a bus fault,
and set the receiver output to a high state. See Figure 15.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
SN65HVD2X
Supply voltage
(2)
, V
CC
–0.5 V to 7 V
Voltage at any bus I/O terminal –27 V to 27 V
Voltage input, transient pulse, A and B, (through 100 Ω, see Figure 16) –60 V to 60 V
Voltage input at any D, DE or RE terminal –0.5 V to VCC+ 0.5 V
Receiver output current, I
O
–10 mA to 10 mA
A, B, GND 16 kV
Human Body Model
(3)
All pins 5 kV
Electrostatic
dischargeElectrostatic discharge
Charged-Device Model
(4)
All pins 1.5 kV
Machine Model
(5)
All pins 200 V
Continuous total power dissipation See Thermal Table
Junction temperature, T
J
150°C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4) Tested in accordance with JEDEC Standard 22, Test Method C101.
(5) Tested in accordance with JEDEC Standard 22, Test Method A115-A
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