Datasheet

SN65HVD233-HT
SLLS933F –NOVEMBER 2008–REVISED AUGUST 2012 www.ti.com
FUNCTION TABLES
(1)
(1) H = high level, L = low level, Z = high impedance, X = irrelevant, ? = indeterminate
DRIVER
INPUTS OUTPUTS
D LBK R
s
CANH CANL BUS STATE
X X >0.75 V
CC
Z Z Recessive
L L or open H L Dominant
≤0.33 V
CC
H or open X Z Z Recessive
X H ≤0.33 V
CC
Z Z Recessive
RECEIVER
INPUTS OUTPUT
BUS STATE V
ID
= V
(CANH)
– V
(CANL)
LBK D R
Dominant V
ID
≥ 0.9 V L or open X L
Recessive V
ID
≤ 0.5 V or open L or open H or open H
? 0.5 V < V
ID
< 0.9 V L or open H or open ?
X X L L
H
X X H H
ABSOLUTE MAXIMUM RATINGS
(1) (2)
over operating free-air temperature range (unless otherwise noted)
VALUE UNIT
V
CC
Supply voltage range –0.3 to 7 V
Voltage range at any bus terminal (CANH or CANL) –36 to 36 V
Voltage input range, transient pulse (CANH and CANL) through 100 Ω (see Figure 8) –100 to 100 V
V
I
Input voltage range (D, R, R
S
, LBK) –0.5 to 7 V
I
O
Receiver output current –10 to 10 mA
CANH, CANL, and GND 16
Human-Body Model (HBM)
(3)
Electrostatic discharge All pins 3 kV
Charged-Device Mode (CDM)
(4)
All pins 1
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4) Tested in accordance with JEDEC Standard 22, Test Method C101.
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