Datasheet
SN65HVD11-HT
www.ti.com
SLLS934E –NOVEMBER 2008–REVISED JUNE 2012
DRIVER SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
T
A
= –55°C to 125°C T
A
= 175°C
(1)
T
A
= 210°C
(2)
PARAMETER TEST CONDITIONS UNIT
MIN TYP MAX MIN TYP MAX MIN TYP MAX
Propagation delay time,
t
PLH
18 25 40 18 25 40 18 25 40 ns
low-to-high-level output
Propagation delay time,
t
PHL
18 25 40 18 25 40 18 25 40 ns
high-to-low-level output
Differential output signal
R
L
= 54 Ω,
t
r
10 21 30 10 22 30 10 22 30 ns
rise time
C
L
= 50 pF,
See Figure 5
Differential output signal
t
f
10 21 30 10 22 30 10 22 30 ns
fall time
t
sk(p)
Pulse skew (|t
PHL
– t
PLH
|) 2.5 2.5 2.5 ns
Part-to-part skew (t
PHL
or
t
sk(pp)
(3)
11 11 11 ns
t
PLH
)
Propagation delay time, R
L
= 110 Ω,
t
PZH
high-impedance to high- RE = 0 V, 55 55 55 ns
level output See Figure 6
Propagation delay time,
t
PHZ
high-level to high- 55 55 55 ns
impedance output
Propagation delay time, R
L
= 110 Ω,
t
PZL
high-impedance to low- RE = 0 V, 55 55 55 ns
level output See Figure 7
Propagation delay time,
t
PLZ
low-level to high- 75 75 75 ns
impedance output
Propagation delay time, R
L
= 110 Ω,
t
PZH
standby to high-level RE = 3 V, 6 6 6 μs
output See Figure 6
R
L
= 110 Ω,
Propagation delay time,
t
PZL
RE = 3 V, 6 6 6 μs
standby to low-level output
See Figure 7
(1) Minimum and maximum parameters are characterized for operation at T
A
= 175°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(2) Minimum and maximum parameters are characterized for operation at T
A
= 210°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(3) t
sk(pp)
is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
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