Datasheet

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LOGIC DIAGRAM
(POSITIVE LOGIC)
1
2
3
4
6
7
A
B
R
RE
DE
D
ABSOLUTE MAXIMUM RATINGS
(1) (2)
SN65HVD10-EP , , SN65HVD11-EP
SN65HVD12-EP
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
(1)
PACKAGE
SIGNALING RATE UNIT LOADS T
A
SOIC MARKING
SOIC
(2) (3)
25 Mbps 1/2 SN65HVD10QDREP V10QEP
– 40 ° C to 125 ° C
10 Mbps 1/8 SN65HVD11QDREP
(4)
V11QEP
1 Mbps 1/8 – 40 ° C to 85 ° C SN65HVD12IDREP V12IEP
25 Mbps 1/2 – 55 ° C to 125 ° C SN65HVD10MDREP V10MEP
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com .
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging .
(3) The D package is taped and reeled as indicated by the R suffix to the part number (i.e., SN65HVD10QDREP).
(4) Product Preview
over operating free-air temperature range (unless otherwise noted)
SN65HVD10-EP
SN65HVD11-EP
SN65HVD12-EP
Supply voltage range, V
CC
– 0.3 V to 6 V
Voltage range at A or B – 9 V to 14 V
Input voltage range at D, DE, R, or RE – 0.5 V to V
CC
+ 0.5 V
Voltage input range, transient pulse, A and B, through 100 Ω (see Figure 11 ) – 50 V to 50 V
A, B, and GND 16 kV
Human body model
(3)
Electrostatic discharge All pins 4 kV
Charged-device model
(4)
All pins Charge 1 kV
See Package Dissipation
Continuous total power dissipation
Rating Table
Storage temperature range, T
stg
– 65 ° C to 150 ° C
Lead temperature 1,6 mm (1/16 in) from case for 10 s 260 ° C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4) Tested in accordance with JEDEC Standard 22, Test Method C101.
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Product Folder Link(s): SN65HVD10-EP SN65HVD11-EP SN65HVD12-EP