Datasheet

Silent Mode
Temperature
Protection
Dominant
Time-Out
Driver
30 mA
V
CC
2
V
CC
/2
30 mA
V
CC
3
1
4
TXD
RXD
8
5
7
6
S
V
ref
CANH
CANL
SN65HVD1050-EP
SLLS772A –DECEMBER 2006–REVISED OCTOBER 2009 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION/ORDERING INFORMATION (CONTINUED)
If a high logic level is applied to the S pin of the SN65HVD1050, the device enters a listen-only silent mode,
during which the driver is switched off while the receiver remains fully functional.
In silent mode, all bus activity is passed by the receiver output to the local protocol controller. When data
transmission is required, the local protocol controller reverses this low-current silent mode by placing a logic low
on the S pin to resume full operation.
A dominant-time-out circuit in the SN65HVD1050 prevents the driver from blocking network communication with
a hardware or software failure. The time-out circuit is triggered by a falling edge on TXD (pin 1). If no rising edge
is seen before the time-out constant of the circuit expires, the driver is disabled. The circuit is then reset by the
next rising edge on TXD.
V
ref
(pin 5) is available as a V
CC
/2 voltage reference.
The SN65HVD1050M is characterized for operation from –55°C to 125°C.
FUNCTION BLOCK DIAGRAM
Absolute Maximum Ratings
(1)
UNIT
V
CC
Supply voltage
(2)
–0.3 V to 7 V
Voltage range at any bus terminal (CANH, CANL, V
ref
) –27 V to 40 V
I
O
Receiver output current 20 mA
V
I
Voltage input, transient pulse
(3)
(CANH, CANL) –200 V to 200 V
V
I
Voltage input range (TXD, S) –0.5 V to 6 V
T
J
Junction temperature –55°C to 170°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with ISO 7637, test pulses 1, 2, 3a, 3b, 5, 6, and 7
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