Datasheet

1
2
3
4
8
7
6
5
TXD
GND
V
CC
RXD
S
CANH
CANL
V
ref
SN65HVD1050
SN65HVD1050
SLLS632B DECEMBER 2005REVISED MARCH 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION (CONTINUED)
Pin 8 provides for two different modes of operation: high-speed or silent mode. The high-speed mode of
operation is selected by connecting S (pin 8) to ground.
If a high logic level is applied to the S pin of the SN65HVD1050, the device enters a listen-only silent mode
during which the driver is switched off while the receiver remains fully functional.
In silent mode, all bus activity is passed by the receiver output to the local protocol controller. When data
transmission is required, the local protocol controller reverses this low-current silent mode by placing a logic-low
on the S pin to resume full operation.
A dominant-time-out circuit in the SN65HVD1050 prevents the driver from blocking network communication with
a hardware or software failure. The time-out circuit is triggered by a falling edge on TXD (pin 1). If no rising edge
is seen before the time-out constant of the circuit expires, the driver is disabled. The circuit is then reset by the
next rising edge on TXD.
V
ref
(pin 5) is available as a V
CC
/2 voltage reference.
The SN65HVD1050 is characterized for operation from –40°C to 125°C.
Table 1. ORDERING INFORMATION
MARKED
PART NUMBER PACKAGE ORDERING NUMBER
AS
SN65HVD1050D (rail)
SN65HVD1050 SOIC-8 VP1050
SN65HVD1050DR (reel)
ABSOLUTE MAXIMUM RATINGS
(1)
UNIT
V
CC
Supply voltage
(2)
–0.3 V to 7 V
Voltage range at any bus terminal (CANH, CANL, V
ref
) –27 V to 40 V
I
O
Receiver output current 20 mA
V
I
Voltage input, transient pulse
(3)
(CANH, CANL) -200 V to 200 V
V
I
Voltage input range (TXD, S) -0.5 V to 6 V
T
J
Junction temperature –55°C to 170°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) Tested in accordance with ISO 7637, test pulses 1, 2, 3a, 3b, 5, 6, and 7.
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