Datasheet

Silent Mode
Over-Temperature
Sensor
Dominant
Time Out
Driver
V
CC
2
V
CC
/2
V
CC
3
1
4
TXD
RXD
8
5
7
6
S
V
ref
/NC
(see Note A)
CANH
CANL
SN65HVD1050A-Q1
www.ti.com
SLLS888A JUNE 2008REVISED JANUARY 2011
EMC-OPTIMIZED HIGH SPEED CAN TRANSCEIVER
Check for Samples: SN65HVD1050A-Q1
1
FEATURES
APPLICATIONS
GMW3122 Dual-Wire CAN Physical Layer
Qualified for Automotive Applications
SAE J2284 High-Speed CAN for Automotive
Improved Drop-In Replacement for TJA1050
Applications
Meets or Exceeds the Requirements of
SAE J1939 Standard Data Bus Interface
ISO 11898-2
ISO 11783 Standard Data Bus Interface
GIFT/ICT Compliant
NMEA 2000 Standard Data Bus Interface
ESD Protection up to ±12 kV (Human-Body
Model) on Bus Pins
DESCRIPTION
High Electromagnetic Compliance (EMC)
The SN65HVD1050A meets or exceeds the
Bus-Fault Protection of –27 V to 40 V
specifications of the ISO 11898 standard for use in
Dominant Time-Out Function
applications employing a Controller Area Network
(CAN). The device is qualified for use in automotive
Thermal Shutdown Protection
applications.
Power-Up/Down Glitch-Free Bus Inputs and
Outputs As a CAN transceiver, this device provides differential
transmit capability to the bus and differential receive
High Input Impedance With Low V
CC
capability to a CAN controller at signaling rates up to
Monotonic Outputs During Power Cycling
1 megabit per second (Mbps)
(1)
.
(1) The signaling rate of a line is the number of voltage
transitions that are made per second expressed in the units
bps (bits per second).
FUNCTION BLOCK DIAGRAM
A. V
ref
on SN65HVD1050A, NC on SN65HVD1050AL
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2008–2011, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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