Datasheet

STB
CANL
V
I
(A)
TXD
R
L
= 60 W
±1%
C
L
(B)
V
OD
t
dom
V
I
900 mV
V
OD
500 mV
V
CC
0 V
V
OD(D)
0 V
CANH
TXD
CANH
CANL
STB
V
in
V
in
0 V
0 V
12 V
-12 V
or
0 V
0 V or V
CC
V
IN
I
OS
-12 V or 12 V
| I
OS(SS)
|
| I
OS(P)
|
200 µs
10 µs
V
(see Note A)
I
1.5 V
CANL
CANH
V
CC
STB
RXD
I
O
C
(see Note B)
L
V
O
V
OL
V
OH
1.5 V
3.5 V
400 mV
t
BUS
0.7 µs
2.65 V
V
I
V
O
SN65HVD1040-Q1
SLLS753D –FEBRUARY 2007– REVISED AUGUST 2011 www.ti.com
A. All V
I
input pulses are from 0 V to V
CC
and supplied by a generator having the following characteristics: t
r
or t
f
≤ 6 ns,
pulse repetition rate (PRR) = 500 Hz, 50% duty cycle.
B. C
L
= 100 pF includes instrumentation and fixture capacitance within ±20%.
Figure 10. Dominant Time-Out Test Circuit and Waveforms
Figure 11. Driver Short-Circuit Current Test and Waveforms
A. For V
I
bit width ≤ 0.7 μs, V
O
= V
OH
. For V
I
bit width ≥ 5 μs, V
O
= V
OL
. V
I
input pulses are supplied from a generator
with the following characteristics: t
r
/t
f
< 6 ns.
B. C
L
= 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 12. t
BUS
Test Circuit and Waveforms
10 Copyright © 2007–2011, Texas Instruments Incorporated