Datasheet

SN65EPT21
SLLS970 –NOVEMBER 2009 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
(1)
PARAMETER CONDITIONS VALUE UNIT
Absolute PECL mode supply voltage V
CC
(GND = 0 V) 3.8 V
Sink/source current, V
BB
±0.5 mA
PECL input voltage GND = 0 V, V
I
≤ V
CC
0 to 3.8 V
Operating temperature range –40 to 85 °C
Storage temperature range –65 to 150 °C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any conditions beyond those indicated under recommended operating conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
DISSIPATION RATINGS
POWER RATING THERMAL RESISTANCE, DERATING FACTOR POWER RATING
CIRCUIT BOARD
JUNCTION-TO-AMBIENT
PACKAGE T
A
< 25°C T
A
> 25°C T
A
= 85°C
MODEL
NO AIRFLOW
(mW) (mW/°C) (mW)
SOIC Low-K 719 139 7 288
High-K 840 119 8 336
MSOP Low-K 469 213 5 188
High-K 527 189 5 211
THERMAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER MIN TYP MAX UNIT
θ
JB
Junction-to-board thermal resistance SOIC 79 °C/W
MSOP 120
θ
JC
Junction-to-case thermal resistance SOIC 98 °C/W
MSOP 74
KEY ATTRIBUTES
CHARACTERISTICS VALUE
Internal input pull-down resistor 50 kΩ
Internal input pull-up resistor 50 kΩ
Moisture sensitivity level Level 1
Flammability rating (oxygen index: 28 to 34) UL 94 V-0 at 0.125 in
Electrostatic discharge Human body model 2 kV
Charged-device model 2 kV
Machine mode 200 V
Meets or exceeds JEDEC Spec EIA/JESD78 latchup test
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