Datasheet

SM72480
TRIP TEST
2
GND
3
OVERTEMP
5
OVERTEMP
V
DD
4
1
NC
6
RESET
Momentary
100k
SM72480
www.ti.com SNIS156C –NOVEMBER 2010–REVISED APRIL 2013
Figure 17. Latch Circuit using OVERTEMP Output
The TRIP TEST pin, normally used to check the operation of the OVERTEMP and OVERTEMP pins, may be
used to latch the outputs whenever the temperature exceeds the programmed limit and causes the digital outputs
to assert. As shown in the figure, when OVERTEMP goes high the TRIP TEST input is also pulled high and
causes OVERTEMP output to latch high and the OVERTEMP output to latch low. The latch can be released by
either momentarily pulling the TRIP TEST pin low (GND), or by toggling the power supply to the device. The
resistor limits the current out of the OVERTEMP output pin.
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