Datasheet

SM72480
TRIP TEST
2
GND
5
OVERTEMP
3
OVERTEMP
V
DD
4
1
100k
NC
6
R1
4.1V
R3
R2
0.1 PF
U3LM4040
R4
V
OUT
V+
V
T
V
TEMP
+
-
U1
SM72480
V
DD
U2
(High = overtemp alarm)
V
T1
V
T2
V
TEMP
V
OUT
V
T1
=
R1 + R2||R3
(4.1)R2
V
T2
=
R2 + R1||R3
(4.1)R2
SM72480
SNIS156C –NOVEMBER 2010–REVISED APRIL 2013 www.ti.com
Most CMOS ADCs found in microcontrollers and ASICs have a sampled data comparator input structure. When
the ADC charges the sampling cap, it requires instantaneous charge from the output of the analog source such
as the SM72480 temperature sensor and many op amps. This requirement is easily accommodated by the
addition of a capacitor (C
FILTER
). The size of C
FILTER
depends on the size of the sampling capacitor and the
sampling frequency. Since not all ADCs have identical input stages, the charge requirements will vary. This
general ADC application is shown as an example only.
Figure 15. Celsius Temperature Switch
Figure 16. TRIP TEST Digital Output Test Circuit
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