Datasheet

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DESCRIPTION (CONTINUED)
BLOCK DIAGRAM
SLK2721
SLLS532B – JUNE 2002 – REVISED MARCH 2007
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
The SLK2721 device provides a comprehensive suite of built-in tests for self-test purposes including local and
remote loopback and pseudorandom bit stream (PRBS) (2
7
-1) generation and verification.
The device comes in a 100-pin VQFP package that requires a single 2.5-V supply with 3.3-V tolerant inputs on
the control pins. The SLK2721 device is very power efficient, dissipating less than 900 mW at 2.488 Gbps, the
OC-48 data rate. It is characterised for operation from –40 ° C to 85 ° C.
2
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