Datasheet

SCANSTA111
SNLS060K AUGUST 2001REVISED APRIL 2013
www.ti.com
PIN DESCRIPTIONS
No.
Pin Name Pins I/O Description
VCC 3 N/A Power
GND 3 N/A Ground
TMS
B
1 I BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP Controller of the
'STA111. Also controls sequencing of the TAPs which are on the local scan chains. This input has a
25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate method). When
the device is power-off (V
DD
floating), this input appears to be a capacitive load to ground
(1)
. When
V
DD
= 0V (i.e.; not floating but tied to V
SS
) this input appears to be a capacitive load with the pull-up
to ground.
TDI
B
1 I BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the 'STA111 through this
input pin. This input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an
alternate method). When the device is power-off (V
DD
floating), this input appears to be a capacitive
load to ground
(1)
. When V
DD
= 0V (i.e.; not floating but tied to V
SS
) this input appears to be a
capacitive load with the pull-up to ground.
TDO
B
1 O BACKPLANE TEST DATA OUTPUT: This output drives test data from the 'STA111 and the local
TAPs, back toward the scan master controller. This output has 24mA of drive current. When the
device is power-off (V
DD
= 0V or floating), this output appears to be a capacitive load
(1)
.
TCK
B
1 I TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock signal that controls all
scan operations of the 'STA111 and of the local scan ports. This input has no pull-up resistor and no
ESD clamp diode (ESD is controlled with an alternate method). When the device is power-off (V
DD
floating), this input appears to be a capacitive load to ground
(2)
. When V
DD
= 0V (i.e.; not floating
but tied to V
SS
) this input appears to be a capacitive load to ground.
TRST
B
1 I TEST RESET: An asynchronous reset signal (active low) which initializes the 'STA111 logic. This
input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate
method). When the device is power-off (V
DD
floating), this input appears to be a capacitive load to
ground
(2)
. When V
DD
= 0V (i.e.; not floating but tied to V
SS
) this input appears to be a capacitive
load with the pull-up to ground.
TRIST
(B,0-2)
4 O TRI-STATE NOTIFICATION OUTPUT: This signal is asserted high when the associated TDO is
TRI-STATEd. Associated means TRIST
B
is for TDO
B
, TRIST
1
is for TDO
1
, etc. This output has
12mA of drive current.
A
B
1 I BACKPLANE PASS-THROUGH INPUT: A general purpose input which is driven to the Y
n
of a
single selected LSP. (Not available when multiple LSPs are selected). This input has an internal
pull-up resistor.
Y
B
1 O BACKPLANE PASS-THROUGH OUTPUT: A general purpose output which is driven from the A
n
of
a single selected LSP. (Not available when multiple LSPs are selected). This output has 24mA of
drive current.
S
(0-6)
7 I SLOT IDENTIFICATION: The configuration of these pins is used to identify (assign a unique
address to) each 'STA111 on the system backplane .
OE 1 I OUTPUT ENABLE for the Local Scan Ports, active low. When high, this active-low control signal
TRI-STATEs all local scan ports on the 'STA111, to enable an alternate resource to access one or
more of the three local scan chains.
TDO
(0-2)
3 O TEST DATA OUTPUTS: Individual output for each of the local scan ports . These outputs have
24mA of drive current.
TDI
(0-2)
3 I TEST DATA INPUTS: Individual scan data input for each of the local scan ports .
TMS
(0-2)
3 O TEST MODE SELECT OUTPUTS: Individual output for each of the local scan ports. TMS
n
does not
provide a pull-up resistor (which is assumed to be present on a connected TMS input, per the IEEE
1149.1 requirement) . These outputs have 24mA of drive current.
TCK
(0-2)
3 O LOCAL TEST CLOCK OUTPUTS: Individual output for each of the local scan ports. These are
buffered versions of TCK
B
. These outputs have 24mA of drive current.
TRST
(0-2)
3 O LOCAL TEST RESETS: A gated version of TRST
B
. These outputs have 24mA of drive current.
A
(0-1)
2 I LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the backplane
pin Y
B
. (Only on LSP
0
and LSP
1
. Only available when a single LSP is selected) . These inputs have
an internal pull-up resistor.
Y
(0-1)
2 O LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the
backplane pin A
B
. (Only on LSP
0
and LSP
1
. Only available when a single LSP is selected) . These
outputs have 24mA of drive current.
(1) Refer to the IBIS model on our website for I/O characteristics.
(2) Refer to the IBIS model on our website for I/O characteristics.
4 Submit Documentation Feedback Copyright © 2001–2013, Texas Instruments Incorporated
Product Folder Links: SCANSTA111