Datasheet

PGA280
SBOS487A –JUNE 2009–REVISED SEPTEMBER 2009................................................................................................................................................ www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE INFORMATION
(1)
PACKAGE PACKAGE
PRODUCT PACKAGE-LEAD DESIGNATOR MARKING
PGA280 TSSOP-24 PW PGA280A
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
PGA280 UNIT
VSN to VSP 40 V
Supply Voltage
VSON to VSOP, and DGND to DVDD 6 V
Signal Input Terminals, Voltage
(2)
VSN – 0.5 to VSP + 0.5 V
Signal Input Terminals, Current
(2)
±10 mA
Output Short-Circuit
(3)
Continuous
Operating Temperature –55 to +140 °C
Storage Temperature –65 to +150 °C
Junction Temperature +150 °C
ESD Ratings Human Body Model (HBM) 2000 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Terminals are diode-clamped to the power-supply (VON and VOP) rails. Signals that can swing more than 0.5V beyond the supply rails
must be current-limited.
(3) Short-circuit to VSON or VSOP, respectively, DGND or DVDD.
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