Datasheet

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SBAS342B − DECEMBER 2004 − REVISED APRIL 2006
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2
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to
damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1)
PCM4201 UNIT
Supply voltage
V
CC
+6.0 V
Supply voltage
V
DD
+3.6 V
Ground voltage differences AGND to DGND ±0.1 V
Digital input voltage RATE, S/M, RST, HPFD SCKI, BCK, FSYNC −0.3 to (V
DD
+ 0.3) V
Analog input voltage V
IN
+, V
IN
− −0.3 to (V
CC
+ 0.3) V
Input current (any pin except supplies) ±10mA mA
Operating temperature range −10 to +70 °C
Storage temperature range, T
STG
−65 to +150 °C
(1)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum
conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or
any other conditions beyond those specified is not implied.
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum located at the end of this
datasheet, or see the TI website at www.ti.com.