Datasheet
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BLOCK DIAGRAM
Single-Ended
MUX and PGA
BCK
V
IN
L1
Reference
V
REF
1
V
REF
2
Delta-Sigma
Modulator
Decimation
Filter
with
High-Pass Filter
Power Supply
AGNDV
CC
V
DD
DGND
Clock and Timing Control
Audio
Data
Interface
Control
Data
Interface
LRCK
DOUT
OVER
TEST0
TEST1
RST
SCKI
V
IN
L2
V
IN
L3
V
IN
L4
V
IN
L5
V
IN
L6
MOUTL
Single-Ended
MUX and PGA
V
IN
R1
Delta-Sigma
Modulator
V
IN
R2
V
IN
R3
V
IN
R4
V
IN
R5
V
IN
R6
MOUTR
V
REF
S
MS (ADR)
(1)
MD (SDA)
(1)
MC (SCL)
(1)
(1)
PCM1850A (PCM1851A)
B0004-09
PIN ASSIGNMENTS
PCM1850A
(TOP VIEW)
23 22 21 20 19
1 2
25
26
27
28
29
30
31
32
16
15
14
13
12
11
10
9
V
IN
R2
V
IN
L2
V
IN
R1
V
IN
L1
MOUTL
MOUTR
RST
TEST1
V
REF
S
V
REF
1
V
REF
2
V
cc
AGND
MS
MC
MD
24 18
3 4 5
6 7 8
17
V
IN
R6
V
IN
L6
V
IN
R5
V
IN
L5
V
IN
R4
V
IN
L4
V
IN
R3
V
IN
L3
LRCK
BCK
DOUT
OVER
DGND
V
DD
SCKI
TEST0
PCM1851A
(TOP VIEW)
23 22 21 20 19
1 2
25
26
27
28
29
30
31
32
16
15
14
13
12
11
10
9
V
IN
R2
V
IN
L2
V
IN
R1
V
IN
L1
MOUTL
MOUTR
RST
TEST1
V
REF
S
V
REF
1
V
REF
2
V
cc
AGND
ADR
SCL
SDA
24 18
3 4 5 6 7 8
17
V
IN
R6
V
IN
L6
V
IN
R5
V
IN
L5
V
IN
R4
V
IN
L4
V
IN
R3
V
IN
L3
LRCK
BCK
DOUT
OVER
DGND
V
DD
SCKI
TEST0
P0040-01
PCM1850A
PCM1851A
SLES173 – MARCH 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
2
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