Datasheet

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DEVICE INFORMATION
ABSOLUTE MAXIMUM RATINGS
PCM1803A
SLES142A JUNE 2005 REVISED AUGUST 2006
TERMINAL FUNCTIONS
TERMINAL
I/O DESCRIPTION
NAME NO.
AGND 6 Analog GND
BCK 11 I/O Audio data bit clock input/output
(1)
BYPAS 8 I HPF bypass control. LOW: Normal mode (dc reject); HIGH: Bypass mode (through)
(2)
DGND 13 Digital GND
DOUT 12 O Audio data digital output
FMT0 17 I Audio data format select input 0. See Data Format section.
(2)
FMT1 18 I Audio data format select input 1. See Data Format section.
(2)
LRCK 10 I/O Audio data latch enable input/output
(1)
MODE0 19 I Mode select input 0. See Data Format section.
(2)
MODE1 20 I Mode select input 1. See Data Format section.
(2)
OSR 16 I Oversampling ratio select input. LOW: ×64 f
S
, HIGH: ×128 f
S
(2)
PDWN 7 I Power-down control, active-low
(2)
SCKI 15 I System clock input: 256 f
S
, 384 f
S
, 512 f
S
, or 768 f
S
(3)
TEST 9 I Test, must be connected to DGND
(2)
V
CC
5 Analog power supply, 5-V
V
DD
14 Digital power supply, 3.3-V
V
IN
L 1 I Analog input, L-channel
V
IN
R 2 I Analog input, R-channel
V
REF
1 3 Reference-voltage-1 decoupling capacitor
V
REF
2 4 Reference-voltage-2 decoupling capacitor
(1) Schmitt-trigger input
(2) Schmitt-trigger input with internal pulldown (50 k , typically), 5-V tolerant
(3) Schmitt-trigger input, 5-V tolerant
over operating free-air temperature range (unless otherwise noted)
(1)
Supply voltage V
CC
–0.3 V to 6.5 V
Supply voltage V
DD
–0.3 V to 4 V
Ground voltage differences AGND, DGND ± 0.1 V
Digital input voltage, V
I
LRCK, BCK, DOUT –0.3 V to (V
DD
+ 0.3 V) < 4 V
Digital input voltage, V
I
PDWN, BYPAS, TEST, SCKI, OSR, FMT0, –0.3 V to 6.5 V
FMT1, MODE0, MODE1
Analog input voltage, V
I
V
IN
L, V
IN
R, V
REF
1, V
REF
2 –0.3 V to (V
CC
+ 0.3 V) < 6.5 V
Input current, I
I
Any pins except supplies ± 10 mA
Ambient temperature under bias, T
bias
–40°C to 125°C
Storage temperature, T
stg
–55°C to 150°C
Junction temperature, T
J
150°C
Lead temperature (soldering) 260°C, 5 s
Package temperature (IR reflow, peak) 260°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3
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