Datasheet

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PIN ASSIGNMENTS
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
V
IN
L
V
IN
R
V
REF
1
V
REF
2
V
CC
AGND
PDWN
BYPAS
TEST
LRCK
MODE1
MODE0
FMT1
FMT0
OSR
SCKI
V
DD
DGND
DOUT
BCK
PCM1803A
(TOP VIEW)
P0009-03
BLOCK DIAGRAM
BCK
V
IN
L
Reference
V
REF
1
V
REF
2
V
IN
R
Delta-Sigma
Modulator
Delta-Sigma
Modulator
×1/64 , ×1/128
Decimation
Filter
With
High-Pass Filter
Power Supply
AGNDV
CC
V
DD
DGND
Clock and Timing Control
Serial
Interface
Mode/
Format
Control
LRCK
DOUT
FMT0
FMT1
MODE0
MODE1
BYPAS
OSR
PDWN
SCKI
B0004-06
TEST
PCM1803A
SLES142A – JUNE 2005 – REVISED AUGUST 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
2
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