Datasheet
www.ti.com
ABSOLUTE MAXIMUM RATINGS
PCM1802
SLES023C – DECEMBER 2001 – REVISED JANUARY 2005
Terminal Functions
TERMINAL
I/O DESCRIPTIONS
NAME PIN
AGND 6 – Analog GND
BCK 11 I/O Bit clock input/output
(1)
BYPAS 8 I HPF bypass control. Low: normal mode (dc cut); High: bypass mode (through)
(2)
DGND 13 – Digital GND
DOUT 12 O Audio data output
FMT0 17 I Audio data format select 0. See data format
(2)
FMT1 18 I Audio data format select 1. See data format
(2)
FSYNC 9 I/O Frame synchronous clock input/output
(1)
LRCK 10 I/O Sampling clock input/output
(1)
MODE0 19 I Mode select 0. See interface mode
(2)
MODE1 20 I Mode select 1. See interface mode
(2)
OSR 16 I Oversampling ratio select. Low: × 64 f
S
; High: × 128 f
S
(2)
PDWN 7 I Power-down control, active-low
(2)
SCKI 15 I System clock input; 256 f
S
, 384 f
S
, 512 f
S
, or 768 f
S
(3)
V
CC
5 – Analog power supply, 5 V
V
DD
14 – Digital power supply, 3.3 V
V
IN
L 1 I Analog input, L-channel
V
IN
R 2 I Analog input, R-channel
V
REF
1 3 – Reference-1 decoupling capacitor
V
REF
2 4 – Reference-2 voltage input, normally connected to V
CC
(1) Schmitt-trigger input
(2) Schmitt-trigger input with internal pulldown (50 k Ω typically), 5-V tolerant
(3) Schmitt-trigger input, 5-V tolerant
over operating free-air temperature range (unless otherwise noted)
(1)
Supply voltage V
CC
6.5 V
V
DD
4 V
Ground voltage differences AGND, DGND ± 0.1 V
Supply voltage difference V
CC
, V
DD
V
CC
– V
DD
< 3.0 V
Digital input voltage FSYNC, LRCK, BCK, DOUT –0.3 V to (V
DD
+ 0.3 V)
PDWN, BYPAS, SCKI, OSR, FMT0, FMT1, MODE0, MODE1 –0.3 V to 6.5 V
Analog input voltage V
IN
L, V
IN
R, V
REF
1, V
REF
2 –0.3 V to (V
CC
+ 0.3 V)
Input current (any pins except supplies) ± 10 mA
Ambient temperature under bias –40 ° C to 125 ° C
Storage temperature –55 ° C to 150 ° C
Junction temperature 150 ° C
Lead temperature (soldering) 260 ° C, 5 s
Package temperature (IR reflow, peak) 260 ° C
(1) Stresses beyond those listed under "absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3