Datasheet

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ABSOLUTE MAXIMUM RATINGS
RECOMMENDED OPERATING CONDITIONS
PCM1774
SLAS551 – JULY 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
over operating free-air temperature range (unless otherwise noted)
(1)
MAX UNIT
Supply voltage V
DD
, V
IO
, V
CC
, V
PA
–0.3 to 4 V
Ground voltage differences: DGND, AGND, PGND ± 0.1 V
Input voltage –0.3 to 4 V
Input current (any pin except supplies) ± 10 mA
Ambient temperature under bias –40 to 110 ° C
Storage temperature –55 to 150 ° C
Junction temperature 150 ° C
Lead temperature (soldering) 260 ° C, 5 s
Package temperature (reflow, peak) 260 ° C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
over operating free-air temperature range (unless otherwise noted)
MIN NOM MAX UNIT
Analog supply voltage, V
CC
, V
PA
2.4 3.3 3.6 V
V
SS
Digital supply voltage, V
DD
, V
IO
1.71 3.3 3.6 V
Digital input logic family CMOS
SCKI system clock 3.072 18.432 MHz
Digital input clock frequency
LRCK sampling clock 8 48 kHz
LOL and LOR 10 k Ω
Analog output load resistance
HPOL and HPOR 16 Ω
Analog output load capacitance 30 pF
Digital output load capacitance 10 pF
T
A
Operating free-air temperature –40 85 ° C
2
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